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Examination of the pathways in the soft X-ray (530.8 eV) induced fragmentation of O2 by electron-ion coincidence measurements

✍ Scribed by D.M. Hanson; D.A. Lapiano-Smith; K. Lee; C.I. Ma; D.Y. Kim


Book ID
107942729
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
778 KB
Volume
162
Category
Article
ISSN
0301-0104

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