Examination of Silicon Wear Debris Generated in a Linear Scratch Test: Scott, C. G.; Danyluk, S. Wear. 1992 Jan 5; 152(1): 183–185

• Book ID: 107889086
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 136 KB
• Volume: 14
• Category: Article
• ISSN: 0141-6359
• DOI: 10.1016/0141-6359(92)90035-u