✦ LIBER ✦
Examination of gradual-junction p-MOS structures for hot carrier control using a new lifetime extraction method
✍ Scribed by Doyle, B.S.; Mistry, K.R.; Jackson, D.B.
- Book ID
- 114534832
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 806 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
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