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Exact computation of maximally dominating faults and its application to n-detection tests for full-scan circuits

✍ Scribed by Polian, I.; Pomeranz, I.; Reddy, S.M.; Becker, B.


Book ID
114448579
Publisher
The Institution of Electrical Engineers
Year
2004
Tongue
English
Weight
311 KB
Volume
151
Category
Article
ISSN
1350-2387

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