Hydrogen release in annealed hydrogenate
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C. Frigeri; M. Serényi; N. Q. Khánh; A. Csik; Z. Erdélyi; L. Nasi; D. L. Beke; H
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Article
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2011
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John Wiley and Sons
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English
⚖ 148 KB
## Abstract A combined study of hydrogenated sputtered single a‐Si and a‐Ge layers and a‐Si/a‐Ge multilayers (MLs) has been carried out in order to establish the reasons of H release and associated structural degradation of the MLs when they are submitted to annealing. ERDA analysis of the single l