✦ LIBER ✦
Evolution of microcrystalline growth pattern by ultraviolet spectroscopic ellipsometry on Si:H films prepared by Hot-Wire CVD
✍ Scribed by Debajyoti Das
- Book ID
- 108269174
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 269 KB
- Volume
- 128
- Category
- Article
- ISSN
- 0038-1098
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