Evolution of grain boundary films in liquid phase sintered silicon nitride during high-temperature testing

✍ Scribed by S Stemmer; G Roebben; O Van der Biest

• Book ID: 108492222
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 457 KB
• Volume: 46
• Category: Article
• ISSN: 1359-6454
• DOI: 10.1016/s1359-6454(98)00183-9