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Evolution of fault-tolerant and noise-robust digital designs

✍ Scribed by Hartmann, M.; Haddow, P.C.

Book ID: 114448569
Publisher: The Institution of Electrical Engineers
Year: 2004
Tongue: English
Weight: 601 KB
Volume: 151
Category: Article
ISSN: 1350-2387
DOI: 10.1049/ip-cdt:20040014

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