Evolution of charge emission for amorphous silicon FETs exposed to radiation

✍ Scribed by S. Zelakiewicz; A. Couture; S. Bogdanovich; J-U. Lee; G. Possin; D. Albagli

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 192 KB
• Volume: 546
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2005.03.052