Evidence of different conduction mechanisms in accumulation-mode p-channel SOI MOSFET's at room and liquid-helium temperatures

✍ Scribed by Rotondaro, A.L.P.; Magnusson, U.K.; Claeys, C.; Flandre, D.; Terao, A.; Colinge, J.-P.

• Book ID: 114535085
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 674 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.202784