𝔖 Bobbio Scriptorium
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Evidence of deep-level defects in an MQW electroabsorption modulator through current-voltage and electrical noise characterization

✍ Scribed by Gautier, C.; Orsal, B.; Devoldere, P.


Book ID
117869355
Publisher
IEEE
Year
1999
Tongue
English
Weight
322 KB
Volume
35
Category
Article
ISSN
0018-9197

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