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Evidence for Frenkel Defect Recombination During Thermal Annealing of Low-Temperature X-Irradiated KCl

โœ Scribed by R. Balzer; H. Peisl; W. Waidelich


Publisher
John Wiley and Sons
Year
1968
Tongue
English
Weight
118 KB
Volume
27
Category
Article
ISSN
0370-1972

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