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Evidence for a composite interface State generation mode in the CHE-stressed deep-submicrometer n-MOSFET

✍ Scribed by Ang, D.S.; Liao, H.; Phua, T.W.H.; Ling, C.H.


Book ID
114617630
Publisher
IEEE
Year
2004
Tongue
English
Weight
159 KB
Volume
51
Category
Article
ISSN
0018-9383

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