Evidence for 1/f noise in diffusion current due to insulator trapping and surface recombination velocity fluctuations

✍ Scribed by R. A. Schiebel; D. Blanks; D. Bartholomew; M. A. Kinch

• Book ID: 112901498
• Publisher: Springer US
• Year: 1993
• Tongue: English
• Weight: 442 KB
• Volume: 22
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02817528