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Evaporation Resistance as a Sensitive Measure of the Purity and Molecular Structure of Monolayers

✍ Scribed by Victor K. La Mer and L. A. G. Aylmore

Book ID: 123656771
Publisher: National Academy of Sciences
Year: 1962
Tongue: English
Weight: 349 KB
Volume: 48
Category: Article
ISSN: 0027-8424
DOI: 10.2307/71200

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