✦ LIBER ✦

Evaporated germanium films as supports for microanalysis of carbon and silicon containing specimens

✍ Scribed by Johansen, B.V.; Ormstad, Heidi

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 310 KB
Volume: 38
Category: Article
ISSN: 1059-910X
DOI: 10.1002/(sici)1097-0029(19970901)38:5<519::aid-jemt9>3.0.co;2-c

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✦ Synopsis

A preparation procedure is described for producing specimen supports of evaporated germanium. The germanium film is used as a replacement for films of carbon and silicon when microanalytical techniques like energy dispersive X-ray microanalysis (XRMA) or electron energy loss spectroscopy (EELS) are focusing on particulates containing these elements. The supports can be produced with high reproducibility within a thickness range of 15 to 30 nm and of a quality suitable also for high resolution transmission electron microscopy.