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Evaluation, verification and error determination of proximity parameters α, β and ν in electron beam lithography

✍ Scribed by S.V. Dubonos; B.N. Gaifullin; H.F. Raith; A.A. Svintsov; S.I. Zaitsev


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
380 KB
Volume
21
Category
Article
ISSN
0167-9317

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