Evaluation of Transmission Line Model Structures for Silicide-to-Silicon Specific Contact Resistance Extraction

✍ Scribed by Stavitski, N.; van Dal, M.J.H.; Lauwers, A.; Vrancken, C.; Kovalgin, A.Y.; Wolters, R.A.M.

• Book ID: 114619367
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 426 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.918658