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Evaluation of the trap concentration in highly doped semiconductors from low-frequency noise spectra

✍ Scribed by Kugler, S.

Book ID: 126510372
Publisher: American Institute of Physics
Year: 1989
Tongue: English
Weight: 581 KB
Volume: 66
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.343909

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