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Evaluation of the reliability of high concentrator GaAs solar cells by means of temperature accelerated aging tests

✍ Scribed by N. Núñez; J. R. González; M. Vázquez; C. Algora; P. Espinet

Book ID: 112174796
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 541 KB
Volume: aop
Category: Article
ISSN: 1062-7995
DOI: 10.1002/pip.2212

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