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Evaluation of the infrared absorption in nm-thick heavily boron-doped Si1-xGexlayers on silicon

✍ Scribed by A. Cavaco; N. A. Sobolev; M. C. Carmo; H. Presting; U. König


Book ID
110299110
Publisher
Springer US
Year
2001
Tongue
English
Weight
238 KB
Volume
12
Category
Article
ISSN
0957-4522

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