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Evaluation of the energy loss of intense pulsed ion beam in thin foil targets

โœ Scribed by Masugata, K.; Yamada, T.; Chishiro, E.; Matsuyama, K.; Yatsui, K.


Book ID
117862913
Publisher
IEEE
Year
1997
Tongue
English
Weight
94 KB
Volume
25
Category
Article
ISSN
0093-3813

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Energy loss of 132Xe-ions in thin foils
โœ W.H. Trzaska; G.N. Knyazheva; J. Perkowski; J. Andrzejewski; S.V. Khlebnikov; E. ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 699 KB

The energy loss of 132 Xe-ions in C, Al, Ni, Ag, Lu, Au, Pb and Th foils was measured in the energy range from 0.1 to 5 MeV/u using the TOF-E method. The results are compared with previously published data and with the predictions of several computer codes. They include theoretical codes: PASS, CASP