Evaluation of the effect of different paint cross section preparation methods on the performances of Fourier transformed infrared microscopy in total reflection mode

✍ Scribed by Prati, S.; Rosi, F.; Sciutto, G.; Oliveri, P.; Catelli, E.; Miliani, C.; Mazzeo, R.

• Book ID: 125451944
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 597 KB
• Volume: 110
• Category: Article
• ISSN: 0026-265X
• DOI: 10.1016/j.microc.2013.04.016