✦ LIBER ✦
Evaluation of surface contamination of titanium dental implants by LV-SEM: comparison with XPS measurements
✍ Scribed by Morra, Marco; Cassinelli, Clara
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 375 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
Low-voltage scanning electron microscopy (LV-SEM) was used to monitor contamination by carbonaceous compounds on the surface of two di †erent commercially available titanium dental implants. Because of its higher surface sensitivity, the LV mode allows us to image contaminating materials on surfaces that are undetected by conventional SEM. Results stemming from LV-SEM observations were compared to surface composition data obtained by XPS analysis. A good relationship between Ðndings obtained by the two techniques was found. 1997 ( John Wiley & Sons, Ltd.