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Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector

✍ Scribed by Kabsch, W. (author)

Book ID: 114500155
Publisher: Wiley-Blackwell
Year: 1988
Tongue: English
Weight: 949 KB
Volume: 21
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889888007903

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