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Evaluation of SiGe:C HBT intrinsic reliability using conventional and step stress methodologies

✍ Scribed by Craig Gaw; T. Arnold; R. Martin; L. Zhang; D. Zupac


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
506 KB
Volume
46
Category
Article
ISSN
0026-2714

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