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Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs

✍ Scribed by Jin, H.; Shinotsuka, H.; Yoshikawa, H.; Iwai, H.; Arai, M.; Tanuma, S.; Tougaard, S.


Book ID
120327868
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
627 KB
Volume
45
Category
Article
ISSN
0142-2421

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