Evaluation of radiation tolerance of FETs used for Astro-E2 hard X-ray detector (HXD-II)

✍ Scribed by Takeshi Itoh; Hisako Niko; Motohide Kokubun; Kazuo Makishima; Madoka Kawaharada; Isao Takahashi; Hiromasa Miyasaka

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 459 KB
• Volume: 541
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2005.01.063