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Evaluation of Qbd for electrons tunneling from the Si/SiO2 interface compared to electron tunneling from the poly-Si/SiO2 interface

✍ Scribed by Gong, S.S.; Burnham, M.E.; Theodore, N.D.; Schroder, D.K.


Book ID
114535165
Publisher
IEEE
Year
1993
Tongue
English
Weight
734 KB
Volume
40
Category
Article
ISSN
0018-9383

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