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Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

✍ Scribed by Pease, R.L.; Gehlhausen, M.; Krieg, J.; Titus, J.; Turflinger, T.; Emily, D.; Cohn, L.

Book ID: 121325025
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 845 KB
Volume: 45
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.736512

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