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Evaluation of mixed-signal noise effects in photon-counting X-ray image sensor readout circuits

✍ Scribed by Jan Lundgren; Suliman Abdalla; Mattias O′Nils; Bengt Oelmann


Book ID
108219581
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
221 KB
Volume
563
Category
Article
ISSN
0168-9002

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