Evaluation of micro-defects by DRAM data retention characteristics measurement

✍ Scribed by K. Miyoshi; K. Terashima; Y. Muramatsu; N. Nishio; T. Murotani; S. Saito

• Book ID: 114168734
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 319 KB
• Volume: 127-128
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(96)00855-5