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Evaluation of junction parameters with control of carrier concentration in Bi2Sr2CaCu2O8+δ stacked junctions

✍ Scribed by K. Inomata; S. Sato; K. Nakajima; S.-J. Kim; T. Hatano; Y. Takano; M. Nagao; T. Yamashita

Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
352 KB
Volume
412-414
Category
Article
ISSN
0921-4534

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