✦ LIBER ✦
Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors
✍ Scribed by M.A. Belaïd; K. Daoud
- Book ID
- 104056442
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 739 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0026-2714
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