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Evaluation of element availability in bottom sediments by synchrotron total reflection X-ray fluorescence analysis (SR-TXRF)

✍ Scribed by S. Moreira; A. E. S. Vives; V. F. Nascimento Filho; O. L. A. D. Zucchi; S. M. B. Brienza

Publisher
Springer
Year
2006
Tongue
English
Weight
126 KB
Volume
270
Category
Article
ISSN
1588-2780

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The use of synchrotron radiation as the excitation source for total reΓ‘ection x-ray Γ‘uorescence analysis (SR-TXRF) in combination with a multilayer structure for monochromatization led to detection limits in the femtogram range for medium-Z elements. Experiments were performed at the Hasylab Beamlin