Evaluation of doping profiles from capacitance measurements : C. van Opdorp, Solid-St. Electron.11 (1968), p. 397

• Book ID: 103268229
• Publisher: Elsevier Science
• Year: 1968
• Tongue: English
• Weight: 98 KB
• Volume: 7
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(68)90141-8