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Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical delay-time modeling

✍ Scribed by Fujishima, M.; Asada, K.; Sugano, T.


Book ID
119774983
Publisher
IEEE
Year
1991
Tongue
English
Weight
641 KB
Volume
26
Category
Article
ISSN
0018-9200

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