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Evaluation of critical stress intensity for crack initiation and rising R-curve behavior in wurtzitic AlN film grown on (001)Si substrate
✍ Scribed by Zhu, Wenliang; Leto, Andrea; Hashimoto, Ken-ya; Pezzotti, Giuseppe
- Book ID
- 123530629
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 516 KB
- Volume
- 537
- Category
- Article
- ISSN
- 0040-6090
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