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Evaluation of Concurrent Flaw Populations in Silicon Carbide in Terms of a Modified Weibull Distribution Function

✍ Scribed by Kalyan K. Phani; Asok K. De

Book ID: 110823916
Publisher: John Wiley and Sons
Year: 1988
Tongue: English
Weight: 239 KB
Volume: 71
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1988.tb05874.x

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