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Evaluation of automated spectroscopic ellipsometry for in-line process control — ESPRIT Semiconductor Equipment Assessment (SEA) Project `IMPROVE'

✍ Scribed by C Pickering; J Russell; V Nayar; J Imschweiler; H Wille; S Harrington; C Wiggins; J.-L Stehlé; J.-P Piel; J Bruchez


Book ID
114086353
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
573 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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