✦ LIBER ✦
Etching Behavior of Silicon Nanowires with HF and NH4F and Surface Characterization by Attenuated Total Reflection Fourier Transform Infrared Spectroscopy: Similarities and Differences between One-Dimensional and Two-Dimensional Silicon Surfaces
✍ Scribed by Chen, W. W.; Sun, X. H.; Wang, S. D.; Lee, S. T.; Teo, Boon K.
- Book ID
- 111972415
- Publisher
- American Chemical Society
- Year
- 2005
- Tongue
- English
- Weight
- 274 KB
- Volume
- 109
- Category
- Article
- ISSN
- 0022-3654
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