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Etch resistance enhancement and absorbance optimization with polyaromatic compounds for the design of 193 nm photoresists

✍ Scribed by P. Argitis; M.A. Vasilopoulou; E. Gogolides; E. Tegou; M. Hatzakis; Z. Kollia; A.C. Cefalas


Book ID
114155807
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
252 KB
Volume
41-42
Category
Article
ISSN
0167-9317

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