Estimation of Trapped Charge Density in SONOS Flash Memory Using a Parallel Capacitor Model

✍ Scribed by Hua-Min Li; Gang Zhang; Won Jong Yoo

• Book ID: 114620657
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 672 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2162730