Estimation of the reliability of computer components from field renewal data: David C. Trindade and Larry D. Haugh. Microelectron. Reliab. 20, 205 (1980)

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 126 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90321-8