Estimation of localized state distribution profiles in undoped and doped a-Si:H by measuring space-charge-limited current

✍ Scribed by S. Furukawa; T. Kagawa; N. Matsumoto

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 346 KB
• Volume: 44
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(82)90306-4