✦ LIBER ✦
Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
✍ Scribed by Schwank, James R.; Shaneyfelt, Marty R.; McMorrow, Dale; Ferlet-Cavrois, Véronique; Dodd, Paul; Heidel, David F.; Marshall, Paul W.; Pellish, Jonathan A.; LaBel, Kenneth A.; Rodbell, Kenneth P.; Hakey, Mark; Flores, Richard S.; Swanson, Scot E.; Dalton, Scott M.
- Book ID
- 119950444
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 549 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9499
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