A new approach for technical efficiency
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John Ruggiero
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Article
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1998
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Elsevier Science
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English
โ 143 KB
The nonparametric technique of Data Envelopment Analysis (DEA) has been used to measure technical eciency. This approach has proven useful because, unlike regression analyses, it allows multiple outputs and does not require a priori functional form speciยฎcation. DEA does, however, require correct mo