Estimating error in measuring thermal conductivity using a T-type nanosensor
✍ Scribed by Yohei Ito; Koji Takahashi; Motoo Fujii; Xing Zhang
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 687 KB
- Volume
- 38
- Category
- Article
- ISSN
- 1099-2871
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✦ Synopsis
Abstract
We discuss the measurement error caused by fabrication and measurement of a T‐type nanosensor with a suspended sub‐micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one‐dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error. © 2009 Wiley Periodicals, Inc. Heat Trans Asian Res; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/htj.20228