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Establishing an accurate depth-scale calibration in the top few nanometers of an ultrashallow implant profile

✍ Scribed by Dowsett, M. G.; Al-Harthi, S. H.; Ormsby, T. J.; Guzmán, B.; Gard, F. S.; Noakes, T. C. Q.; Bailey, P.; McConville, C. F.


Book ID
121220932
Publisher
The American Physical Society
Year
2002
Tongue
English
Weight
168 KB
Volume
65
Category
Article
ISSN
1098-0121

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