ESEM imaging of polyfluorene blend cross-sections for organic devices

✍ Scribed by C.M Ramsdale; I.C Bache; J.D MacKenzie; D.S Thomas; A.C Arias; A.M Donald; R.H Friend; N.C Greenham

• Book ID: 104428135
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 114 KB
• Volume: 14
• Category: Article
• ISSN: 1386-9477
• DOI: 10.1016/s1386-9477(02)00392-2

✦ Synopsis

We report the use of environmental scanning electron microscopy (ESEM) to determine the phase separation in the cross-section of a 200 nm thick poly uorene blend ÿlm, of the type used in polymer photovoltaic devices and LEDs. The micron and sub-micron surface phases are found to penetrate through the ÿlm to the underlying substrate, whilst smaller surface features do not necessarily propagate through the ÿlm. The observed cross-sectional structure helps to explain the optoelectronic response of these blends and shows that ESEM is an e ective tool in the characterisation of polymer blend cross-sections.